Int J Performability Eng ›› 2020, Vol. 16 ›› Issue (1): 37-47.doi: 10.23940/ijpe.20.01.p5.3747
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Wanjuan Zhanga, Xiaodan Wanga, Diego Cabrerab, and Yun Baia*()
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Contact:
Yun Bai
E-mail:yunbai@foxmail.com
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Wanjuan Zhang, Xiaodan Wang, Diego Cabrera, and Yun Bai. Product Quality Reliability Analysis based on Rough Bayesian Network [J]. Int J Performability Eng, 2020, 16(1): 37-47.
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