Reliability Analysis for Multiple Dependent Failure Processes: An MEMS Application
QIANMEI FENG1 and DAVID W. COIT2
1Department of Industrial Engineering, University of Houston, Houston, TX, USA 2Department of Industrial & Systems Engineering, Rutgers University, Piscataway, NJ, US
QIANMEI FENG DAVID W. COIT. Reliability Analysis for Multiple Dependent Failure Processes: An MEMS Application [J]. Int J Performability Eng, 2010, 6(1): 100-102.