Username   Password       Forgot your password?  Forgot your username? 

Analysis of Three-State Device Parallel System Subject to Time Varying Open-Mode Failure and Repair Rates

Volume 5, Number 4, July 2009 -SC 17 - pp. 393-396

M. A. EL-DAMCESE1 and M. M. KHALIFA2

1Department of Mathematics, Faculty of Science, Tanta University, Egypt

2Department of Mathematics, Faculty of Education, Kafr El-Sheikh University, Egypt

 

(Received on September 8, 2008, revised March 24, 2009)


    Abstract:

    In this paper, we study the effect of critical human errors and common-cause failures on the performance of a system composed of three-state devices parallel components assuming that the open-mode failure rates of the operating units and the repair rates of the units failed due to open-mode failure are time varying. In this case, the system fails when a device fails in short-mode, or a common-cause failure or a critical human error occurs, or all devices fail in open-mode. The Markov method is used to develop generalized expressions for system state probabilities, system availability and reliability.

     

    References: 06

    Click here to download the paper.

    Please note : You will need Adobe Acrobat viewer to view the full articles.   Get Free Adobe Reader

     
    This site uses encryption for transmitting your passwords. ratmilwebsolutions.com