Analysis of Three-State Device Parallel System Subject to Time Varying Open-Mode Failure and Repair Rates
Volume 5, Number 4, July 2009 -SC 17 - pp. 393-396
M. A. EL-DAMCESE1 and M. M. KHALIFA2
1Department of Mathematics, Faculty of Science, Tanta University, Egypt
2Department of Mathematics, Faculty of Education, Kafr El-Sheikh University, Egypt
(Received on September 8, 2008, revised March 24, 2009)
In this paper, we study the effect of critical human errors and common-cause failures on the performance of a system composed of three-state devices parallel components assuming that the open-mode failure rates of the operating units and the repair rates of the units failed due to open-mode failure are time varying. In this case, the system fails when a device fails in short-mode, or a common-cause failure or a critical human error occurs, or all devices fail in open-mode. The Markov method is used to develop generalized expressions for system state probabilities, system availability and reliability.
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