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Generalized Exponential Poisson Model for Software Reliability Growth

Volume 2, Number 3, July 2006 - Paper 7  - pp. 291 - 301


1Electronics Test and Development Centre (ETDC) and Centre For Reliability (CFR), Chennai 600 041, India
2Department of Statistics, University of Madras, Chennai 600 005, India

(Received on April 14, 2006)


Software reliability modeling is challenging since no single Software Reliability Growth Model (SRGM) is considered suitable in all situations owing to poor goodness of fit, lack of predictive validity of the models and their sensitivity to fluctuations in the number of failures in the data sets. In this paper, we propose a Non-Homogenous Poisson Process Model whose failure intensity function has the same Mathematical form as that of the probability density function (pdf) of a generalized exponential distribution. The performance of the proposed model was verified and also compared with six chosen SRGMs using failure data from 18 software systems and the model is found to be adequate in terms of goodness of fit statistic and predictive validity. It is also less sensitive to fluctuations in data.


References: 18

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