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ISSUES BY YEAR

Volume 13 - 2017

No.4 July 2017
No.4 July 2017
No.5 September 2017
No.5 September 2017
No.7 November 2017
No.7 November 2017

Volume 12 - 2016

Volume 11 - 2015

Volume 10 - 2014

Volume 9 - 2013

Volume 8 - 2012

Volume 7 - 2011

Volume 6 - 2010

Volume 5 - 2009

Volume 4 - 2008

Volume 3 - 2007

Volume 2 - 2006

FORTHCOMING ISSUES OF IJPE

 

 

Table of Contents of Forthcoming Special Issue of International Journal of

Performability Engineering, Vol.11, No.4, July, 2015

on  

Stochastic Reliability Modeling and Optimization 

Author/s

Title of the Paper

Pages

Krishna B. Misra

Editorial

301

 

General Guidelines for Contributors

302

Joh Tadashi Dohi, Japan

Won Young Yun, South Korea.

Guest Editorial

302-304

Special Issue Papers

Harish Sukhwani, Andrea Bobbio, and Kishor S. Trivedi, U.S.A.

Largeness Avoidance in Availability Modeling using Hierarchical and Fixed-point Iterative Techniques

305-319

Toshio Nakagawa, Japan and Xufeng Zhao, Qatar

A Survey of Replacement Policies for Parallel Systems with Newly Proposed Approaches

321-328

Fumio Ohi, Japan

Converting a Multi-state System into a Family of Binary State Systems

329-338

Xiao Xiao, Yi Chen, Natsumi Takahashi, and Hisashi Yamamoto, Japan

Magnitude Relation of the All-terminal Reliability of Network Systems

339-348

Xufeng Zhao, Qatar,

Syouji Nakamura, and Toshio Nakagawa, Japan

Optimal Data Transfer Strategies for the Hierarchical Storage Management within a Server System

349-356

Young Jin Han, Won Young Yun, and Ji Young Lee, South Korea

A Simulation-based Multi-level Redundancy Allocation for a Multi-level System

357-367

Kazuya Shibata, Koichiro Rinsaka, and Tadashi Dohi, Japan

M-SRAT: Metrics-based Software Reliability Assessment Tool

369-379

Regular Papers

Qiuyang Li, China,

Gordon J. Savage, Canada Young Kap Son, South Korea

Economic, Robust and Quality Design of Engineering Systems using a Hybrid Six Sigma-second Moment Approach

381-394

D. R. Prajapati and Sukhraj Singh, India

Application of ANN to Monitor the Correlated Process using Higher Sample Size

395-404

Book Reviews 

320,368

An Update on IJPE

380


 

 


 
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