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SC IJPE 21
Justin R. Chimka and Qin HongDepartment of Industrial Engineering, University of Arkansas, Fayetteville, AR 72701, USA
Received on: July 15, 2009
The search for a theoretically appropriate (ordinal) and practically superior alternative to demerits should motivate the formal introduction of a simple demerit system with known type I errors. Therefore we present a new statistical quality control model of ordinal data, based on the binomial (n, p) distribution, and derive a general expression for the demerit chart's type I error rate. Furthermore, an application shows that the system is good for some combinations of n and p, and motivates discussion of future work toward economic design and comparison with future models.
Status: Published in Vol.6, No. 1, January 2010, pp.103-105.