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A Simple New Demerit System

SC IJPE 21

Justin R. Chimka and Qin Hong

Department of Industrial Engineering, University of Arkansas, Fayetteville, AR 72701, USA

 

Received on: July 15, 2009

 

Abstract:

The search for a theoretically appropriate (ordinal) and practically superior alternative to demerits should motivate the formal introduction of a simple demerit system with known type I errors. Therefore we present a new statistical quality control model of ordinal data, based on the binomial (n, p) distribution, and derive a general expression for the demerit chart's type I error rate. Furthermore, an application shows that the system is good for some combinations of n and p, and motivates discussion of future work toward economic design and comparison with future models.

 

Status: Published in Vol.6, No. 1, January 2010  pp. 103-105.