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A New Insight into k-out-of-n Warm Standby Model

SC IJPE 24

Suprasad V. Amari1 and Hoang Pham2

1 Parametric Technology Corporation, Greensburg, PA 15601, USA
2 Rutgers University, Piscataway, NJ 08855, USA

 

Received on: February 24, 2010

 

Abstract:

We provide a new insight into k-out-of-n warm standby model with identical components subject to exponential lifetime distributions. We show that all properties and computational procedures that are applicable for active redundancy are also applicable for the warm standby redundancy. In addition, we show that the reliability of both active and warm standby systems can be calculated using beta distribution. Similarly, the improvement in system reliability with an additional redundant component follows negative binomial (Pólya) distribution.

 

Status: Published in IJPE, Vol. 6, No. 6, November 2010, pp. 615-617.