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A New Insight into k-out-of-n Warm Standby Model


Suprasad V. Amari1 and Hoang Pham2

1 Parametric Technology Corporation, Greensburg, PA 15601, USA
2 Rutgers University, Piscataway, NJ 08855, USA


Received on: February 24, 2010



We provide a new insight into k-out-of-n warm standby model with identical components subject to exponential lifetime distributions. We show that all properties and computational procedures that are applicable for active redundancy are also applicable for the warm standby redundancy. In addition, we show that the reliability of both active and warm standby systems can be calculated using beta distribution. Similarly, the improvement in system reliability with an additional redundant component follows negative binomial (Pólya) distribution.


Status: Published in Vol. 6, No. 6, November 2010, pp. 615-617.

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