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A Simple New Demerit System
JUSTIN R CHIMKA and QIN HONG
Department of Industrial Engineering, University of Arkansas, Fayetteville, AR 72701, USA
Abstract:
The search for a theoretically appropriate (ordinal) and practically superior alternative to demerits should motivate the formal introduction of a simple demerit system with known type I errors. Therefore we present a new statistical quality control model of ordinal data, based on the binomial (n, p) distribution, and derive a general expression for the demerit chart's type I error rate. Furthermore an application shows that the system is good for some combinations of n and p, and motivates discussion of future work toward economic design and comparison with future models.
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